New 60Gbps solution expands on Teradyne’s UltraFLEX test system’s capabilities
The UltraSerial60G is an addition to Teradyne’s UltraFLEX platform and expands the platform’s capabilities, enabling customers to test their device at the target data rate in the device’s mission mode to ensure it meets the most demanding standards.
The UltraSerial60G simplifies design-for-test processes and shortens new device bring up time. The solution features leading high test parallelism with support for both NRZ and PAM4 serial communications protocols.
“The UltraFLEX platform continues to evolve to pioneer new capabilities and keep pace with our customers’ needs,” said
The UltraSerial60G instrument contains 32 differential transmitters and 32 differential receivers that can generate and measure NRZ data at up to 32Gbps and PAM4 data at up to 60 Gbps. Each differential receiver has a 25GHz bandwidth digitizer that allows bench-top test quality with no additional DIB circuitry. The instrument also features a bits-to-RF test capability in a single insertion for the next generation 5G RF devices.
The UltraSerial60G is supported by IG-XL, the leading ATE test software, for rapid program development.
Availability
The UltraSerial60G instrument is now available for customer orders. More information can be found at the Teradyne website: https://www.teradyne.com/products/test-solutions/semiconductor-test/ultraserial60g.
About Teradyne
Teradyne (NYSE:TER) is a leading supplier of automation equipment for test and industrial applications. Teradyne Automatic Test Equipment (ATE) is used to test semiconductors, wireless products, data storage and complex electronic systems, which serve consumer, communications, industrial and government customers. Our Industrial Automation products include collaborative robots used by global manufacturing and light industrial customers to improve quality and increase manufacturing efficiency. In 2017, Teradyne had revenue of
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