NORTH READING, Mass.--(BUSINESS WIRE)--
Inc. (NYSE:TER) introduces a LCD Driver instrument solution that
extends the J750Ex-HD test coverage for the mobile display driver test
market. Teradyne’s LCD Solution is a focused instrument that provides
improved cost-of-test economics compared to competitive systems for
Display Drivers (DDI) and emerging Touch Display Driver Integration
devices (TDDI). It can be ordered as a standard J750 system option or
easily upgraded to on over 1,000 J750 systems installed at Outsourced
Semiconductor Assembly and Test (OSAT) facilities worldwide.
Multiple mobile display driver semiconductor companies have realized
improved cost-of-test when releasing devices into volume production with
the LCD solution compared to alternative automatic test equipment (ATE).
Teradyne has also received several multi-system orders from OSATs which
are now running volume production.
“The LCD Driver market is extremely cost sensitive. Therefore, we
designed the LCD solution to take advantage of the J750 platform’s small
footprint, high throughput and low cost-of-ownership,” said Jason Zee,
General Manager of Teradyne’s Consumer Business Unit. ”The result is an
instrument solution that reduces cost-of-test for mobile display drivers
and an instrument architecture that addresses current and emerging
display driver test requirements, including TDDI. TDDI is a key trend to
enable lower cost and improved user experience within the smartphone
market over the midterm”
“IHS forecasts TDDI shipments to increase from 2.6 million in 2015 to
89.3 million in 2020,” says Display Driver Market Analyst Tadashi Uno,
Teradyne LCD Test Solution for J750Ex-HD
Teradyne’s LCD Test Solution includes up to 2,416-measurement channels
for LCD source driver testing, a high-speed instrument for serial
display interface test such as MIPI, plus graphical debug tools for
grayscale measurement analysis within J750’s IG-XL software. New J750
system features include background DSP designed to reduce the test time
for computational intensive tasks such as the grayscale measurements.
For display devices with embedded memory, the J750 includes memory and
concurrent test options designed to enable the memory block to be tested
in parallel with other device logic to increase overall test cell
throughput and lower cost of test. Finally, as TDDI adoption increases,
driving the need for a touch sensor test capability, the J750 High
Density Converter Test Option (HD CTO)can easily be added to the J750.
The instrument is widely deployed for discrete touchscreen controller
testing at multiple semiconductor companies.
(NYSE:TER) is a leading supplier of automation solutions for test and
industrial applications. Teradyne Automated Test Equipment (ATE) is used
to test semiconductors, wireless products, data storage and complex
electronic systems, which serve consumer, communications, industrial and
government customers. Our Industrial Automation solutions include
Collaborative Robots used by global manufacturing and light industrial
customers to improve quality and increase manufacturing efficiency. In
2014, Teradyne had revenue of $1.65 billion and currently employs
approximately 4,000 people worldwide. For more information, visit www.teradyne.com.
Teradyne (R) is a registered trademark of Teradyne, Inc. in the U.S. and
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Jessica Faulkner, 978-370-1437