"By 2020, analysts project over 50 billion devices will be connected to
the internet, many with a wireless interface. These devices require test
systems with balanced mixed-signal, digital and RF test capabilities,"
said Houken Tseng, Teradyne Greater China Field Operations Manager.
"
The ETS-88RF™ is an innovative high-performance multisite production test system designed to test a wide variety of RF Power Amplifiers, Front End Modules, Switches, RF Transistors and other devices. Its scalable design builds on the popular ETS-88™ test system, which is an industry leader for testing power, linear and analog devices. The ETS-88 family now includes RF test coverage for both probe and final test applications while maintaining compatibility with existing programs and interface hardware. This wide range of capability reduces the overall cost of ownership while the scalable architecture minimizes the cost of test.
With the proliferation of RF into microcontrollers and other stand-alone wireless SoC devices, the introduction of LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity and cellular standards. The J750-LitePoint provides dedicated on-instrument DSP for high throughput RF signal processing, an extensive wireless software library and a comprehensive debug tool suite. Now, the J750 can test an even broader range of applications while continuing to deliver superior cost efficient and rapid time to market.
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jessica.faulkner@teradyne.com
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